Terahertz Lichtfeld Kamera Prototyp
Ursprünglich wurde das Konzept der Lichtfeld-Bildgebung im sichtbaren Bereich des Spektrums realisiert. Unser Lehrstuhl ist führend in der Entwicklung von Lichtfeld-Verfahren für das THz Spektrum, wodurch fundamentales Verständnis gefördert und neue Hardware entwickelt wird um das THz Band zu erschließen. Zurzeit forschen wir an einem THz-Lichtfeld-Kamera Prototypen, der aus einer 3x3 Matrix von Linsen-gekoppelten 1k-Pixel THz CMOS Kameras besteht, integriert auf einem PCB. Der CMOS Kamera Chip wurde auf der International Solid-State Circuits Conference (ISSCC) 2021 präsentiert. Die Abbildung zeigt den Prototypen der Lichtfeld-Kamera. Dieser Prototyp dient als Hardware-Plattform für die Entwicklung von THz-Lichtfeld 3-D Bildgebungsverfahren in Echtzeit.
- 2024
3772.
Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers' Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Seite 24—31
Herausgeber: ACM, New York, NY, USA
2024ISBN: 9798400705717
3771.
Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers’ Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Seite 24—31
Herausgeber: ACM, New York, NY, USA
2024ISBN: 9798400705717
3770.
Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers’ Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Seite 24—31
Herausgeber: ACM, New York, NY, USA
2024ISBN: 9798400705717
3769.
Ndagijimana, Adolphe; Ederra, Iñigo; Conde, Miguel Heredia
Impact of Diffraction on Terahertz Compressed Sensing Single-Pixel Imaging
2024 International Workshop on the Theory of Computational Sensing and its Applications to Radar, Multimodal Sensing and Imaging (CoSeRa), Seite 76-80
20243768.
Hahn, Yannik; Maack, Robert; Tercan, Hasan; Meisen, Tobias; Purrio, Marion; Buchholz, Guido; Angerhausen, Matthias
Quality Prediction in Arc Welding: Leveraging Transformer Models and Discrete Representations from Vector Quantised-VAE
In Serra, Edoardo and Spezzano, Francesca, Editor, Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, Seite 4522—4529
In Serra, Edoardo and Spezzano, Francesca, Editor
Herausgeber: ACM, New York, NY, USA
2024ISBN: 9798400704369
3767.
Weiss, Moritz; Brierley, Nick; Schmid, Mirko; Meisen, Tobias
End-To-End Deep Learning Material Discrimination Using Dual-Energy LINAC-CT
e-Journal of Nondestructive Testing, 29 (3)
20243766.
Krabbe, Jan-Christoph; Bauer, Adrian; Kollek, Kevin; Meusener, Jan-Hendrik; Kummert, Anton
FPSeg: Flexible Promptable Semantic Segmentation for Edge Devices
2024 IEEE International Symposium on Circuits and Systems (ISCAS), Seite 1-5
20243765.
Krah, J. O.; Holtz, J.
Fast Current Limiting with Virtual Synchronous Generators
2024 4th International Conference on Smart Grid and Renewable Energy (SGRE), Seite 1--6
20243764.
Ahmed, Faisal; Heredia Conde, Miguel; López Martínez, Paula
Evaluation of Kalman Filter-Aided GIPS for Passive ToF 3D Sensing
2024 International Workshop on the Theory of Computational Sensing and its Applications to Radar, Multimodal Sensing and Imaging (CoSeRa), Seite 117-121
20243763.
Ahmed, Faisal; Heredia Conde, Miguel; López Martínez, Paula
Evaluation of Kalman Filter-Aided GIPS for Passive ToF 3D Sensing
2024 International Workshop on the Theory of Computational Sensing and its Applications to Radar, Multimodal Sensing and Imaging (CoSeRa), Seite 117-121
20243762.
Weiss, Moritz; Brierley, Nick; Schmid, Mirko; Meisen, Tobias
End-To-End Deep Learning Material Discrimination Using Dual-Energy LINAC-CT
e-Journal of Nondestructive Testing, 29 (3)
20243761.
Weiss, Moritz; Brierley, Nick; Schmid, Mirko; Meisen, Tobias
End-To-End Deep Learning Material Discrimination Using Dual-Energy LINAC-CT
e-Journal of Nondestructive Testing, 29 (3)
20243760.
Weiss, Moritz; Brierley, Nick; Schmid, Mirko; Meisen, Tobias
End-To-End Deep Learning Material Discrimination Using Dual-Energy LINAC-CT
e-Journal of Nondestructive Testing, 29 (3)
20243759.
Krabbe, Jan-Christoph; Bauer, Adrian; Kollek, Kevin; Meusener, Jan-Hendrik; Kummert, Anton
FPSeg: Flexible Promptable Semantic Segmentation for Edge Devices
2024 IEEE International Symposium on Circuits and Systems (ISCAS), Seite 1-5
20243758.
Lopez Paredes, Alvaro; Gutierrez-Barragan, Felipe; Heredia Conde, Miguel
Gram-Guided Error-Correction for Highly-Coherent Dictionaries and its Application to CS-ToF Imaging
2024 32nd European Signal Processing Conference (EUSIPCO), Seite 2687-2691
20243757.
Lopez Paredes, Alvaro; Gutierrez-Barragan, Felipe; Heredia Conde, Miguel
Gram-Guided Error-Correction for Highly-Coherent Dictionaries and its Application to CS-ToF Imaging
2024 32nd European Signal Processing Conference (EUSIPCO), Seite 2687-2691
20243756.
Langer, Tristan; Meyes, Richard; Meisen, Tobias
Guided Exploration of Industrial Sensor Data
Computer Graphics Forum, 43 (1)
2024
ISSN: 0167-70553755.
Langer, Tristan; Meyes, Richard; Meisen, Tobias
Guided Exploration of Industrial Sensor Data
Computer Graphics Forum, 43 (1)
2024
ISSN: 0167-70553754.
Arndt, Patrick; Niewiadomski, Karol; Tutsch, Dietmar
Hardware Accelerated Matrix Multiplication for Embedded Systems
2024 IEEE International Conference on Consumer Electronics (ICCE), Seite 1-6
20243753.
Langer, Tristan; Meyes, Richard; Meisen, Tobias
Guided Exploration of Industrial Sensor Data
Computer Graphics Forum, 43 (1)
2024
ISSN: 0167-70553752.
Langer, Tristan; Meyes, Richard; Meisen, Tobias
Guided Exploration of Industrial Sensor Data
Computer Graphics Forum, 43 (1)
2024
ISSN: 0167-70553751.
Langer, Tristan; Meyes, Richard; Meisen, Tobias
Guided Exploration of Industrial Sensor Data
Computer Graphics Forum, 43 (1)
2024
ISSN: 0167-70553750.
Walsemann, Alexander; Karagounis, Michael; Stanitzki, Alexander; Tutsch, Dietmar
Fault tolerance evaluation study of a RISC-V microprocessor for HEP applications
Journal of Instrumentation, 19
2024- 2023
3749.
Haussmann, N.; Stroka, S.; Mazaheri, S.; Clemens, M.
Using Point Clouds for Material Properties Smoothing in Low-Frequency Numerical Dosimetry Simulations
21st Biennial IEEE Conference on Electromagnetic Field Computation (CEFC 2024)
Jeju, South Korea
02.-05.06.2024
Dezember 20233748.
Kähne, B.; Clemens, M.
A GPU Accelerated Semi-Implicit Method for Large-Scale Nonlinear Eddy-Current Problems Using Adaptive Time Step Control
21st Biennial IEEE Conference on Electromagnetic Field Computation (CEFC 2024)
Jeju, South Korea
02.-05.06.2024
Dezember 2023