Terahertz Lichtfeld Kamera Prototyp
Ursprünglich wurde das Konzept der Lichtfeld-Bildgebung im sichtbaren Bereich des Spektrums realisiert. Unser Lehrstuhl ist führend in der Entwicklung von Lichtfeld-Verfahren für das THz Spektrum, wodurch fundamentales Verständnis gefördert und neue Hardware entwickelt wird um das THz Band zu erschließen. Zurzeit forschen wir an einem THz-Lichtfeld-Kamera Prototypen, der aus einer 3x3 Matrix von Linsen-gekoppelten 1k-Pixel THz CMOS Kameras besteht, integriert auf einem PCB. Der CMOS Kamera Chip wurde auf der International Solid-State Circuits Conference (ISSCC) 2021 präsentiert. Die Abbildung zeigt den Prototypen der Lichtfeld-Kamera. Dieser Prototyp dient als Hardware-Plattform für die Entwicklung von THz-Lichtfeld 3-D Bildgebungsverfahren in Echtzeit.
Vorangegangene Arbeiten
- 2023
3672.
Langer, Tristan; Pomp, André; Meisen, Tobias
Towards a Data Space for Interoperability of Analytic Provenance
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor, Companion Proceedings of the ACM Web Conference 2023, Seite 1502—1503
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor
Herausgeber: ACM, New York, NY, USA
2023ISBN: 9781450394192
3671.
Langer, Tristan; Pomp, André; Meisen, Tobias
Towards a Data Space for Interoperability of Analytic Provenance
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor, Companion Proceedings of the ACM Web Conference 2023, Seite 1502—1503
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor
Herausgeber: ACM, New York, NY, USA
2023ISBN: 9781450394192
3670.
Langer, Tristan; Pomp, André; Meisen, Tobias
Towards a Data Space for Interoperability of Analytic Provenance
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor, Companion Proceedings of the ACM Web Conference 2023, Seite 1502—1503
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor
Herausgeber: ACM, New York, NY, USA
2023ISBN: 9781450394192
3669.
Hahn, Yannik; Langer, Tristan; Meyes, Richard; Meisen, Tobias
Time Series Dataset Survey for Forecasting with Deep Learning
Forecasting, 5 (1) :315—335
20233668.
Walsemann, Alexander; Karagounis, Michael; Stanitzki, A.; Tutsch, Dietmar
STRV — A Radiation Hard RISC-V Microprocessor for High-Energy Physics Applications
Journal of Instrumentation, 18
20233667.
Grzyb, J.; Andree, M.; Heinemann, B.; Rucker, H.; Pfeiffer, U. R.
On Cold Operation of an SiGe HBT as a Broadband Low-NEP THz Direct Detector
2023 48th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Seite 1-2
20233666.
Jansen, Maike; Meisen, Tobias; Plociennik, Christiane; Berg, Holger; Pomp, André; Windholz, Waldemar
Stop Guessing in the Dark: Identified Requirements for Digital Product Passport Systems
Systems, 11 (3) :123
20233665.
Samsonov, Vladimir; Chrismarie, Enslin; Köpken, Hans-Georg; Bär, Schirin; Lütticke, Daniel; Meisen, Tobias
Deep representation learning and reinforcement learning for workpiece setup optimization in CNC milling
Production Engineering
2023
ISSN: 0944-65243664.
Paulus, Alexander; Burgdorf, Andreas; Pomp, André; Meisen, Tobias
Collaborative Filtering Recommender System for Semantic Model Refinement
2023 IEEE 17th International Conference on Semantic Computing (ICSC), Seite 183—190
Herausgeber: IEEE
2023ISBN: 978-1-6654-8263-9
3663.
Companion Proceedings of the ACM Web Conference 2023
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor
Herausgeber: ACM, New York, NY, USA
2023ISBN: 9781450394192
3662.
Companion Proceedings of the ACM Web Conference 2023
In Ding, Ying and Tang, Jie and Sequeda, Juan and Aroyo, Lora and Castillo, Carlos and Houben, Geert-Jan, Editor
Herausgeber: ACM, New York, NY, USA
2023ISBN: 9781450394192
3661.
Waubert-de-Puiseau, Constantin; Tercan, Hasan; Meisen, Tobias
Curriculum Learning in Job Shop Scheduling using Reinforcement Learning
20233660.
Waubert-de-Puiseau, Constantin; Tercan, Hasan; Meisen, Tobias
Curriculum Learning in Job Shop Scheduling using Reinforcement Learning
20233659.
Waubert-de-Puiseau, Constantin; Tercan, Hasan; Meisen, Tobias
Curriculum Learning in Job Shop Scheduling using Reinforcement Learning
20233658.
Waubert-de-Puiseau, Constantin; Tercan, Hasan; Meisen, Tobias
Curriculum Learning in Job Shop Scheduling using Reinforcement Learning
20233657.
Waubert-de-Puiseau, Constantin; Tercan, Hasan; Meisen, Tobias
Curriculum Learning in Job Shop Scheduling using Reinforcement Learning
20233656.
Samsonov, Vladimir; Chrismarie, Enslin; Köpken, Hans-Georg; Bär, Schirin; Lütticke, Daniel; Meisen, Tobias
Deep representation learning and reinforcement learning for workpiece setup optimization in CNC milling
Production Engineering
2023
ISSN: 0944-65243655.
Samsonov, Vladimir; Chrismarie, Enslin; Köpken, Hans-Georg; Bär, Schirin; Lütticke, Daniel; Meisen, Tobias
Deep representation learning and reinforcement learning for workpiece setup optimization in CNC milling
Production Engineering
2023
ISSN: 0944-65243654.
Samsonov, Vladimir; Chrismarie, Enslin; Köpken, Hans-Georg; Bär, Schirin; Lütticke, Daniel; Meisen, Tobias
Deep representation learning and reinforcement learning for workpiece setup optimization in CNC milling
Production Engineering
2023
ISSN: 0944-65243653.
Paulus, Alexander; Burgdorf, Andreas; Pomp, André; Meisen, Tobias
Collaborative Filtering Recommender System for Semantic Model Refinement
2023 IEEE 17th International Conference on Semantic Computing (ICSC), Seite 183—190
Herausgeber: IEEE
2023ISBN: 978-1-6654-8263-9
3652.
Samsonov, Vladimir; Chrismarie, Enslin; Köpken, Hans-Georg; Bär, Schirin; Lütticke, Daniel; Meisen, Tobias
Deep representation learning and reinforcement learning for workpiece setup optimization in CNC milling
Production Engineering
2023
ISSN: 0944-65243651.
Maiero, Jens; Fehling, Christian Dominic; Müser, Sinja
Does Higher Education Need Virtual Reality? A Survey
2023 11th International Conference on Information and Education Technology (ICIET), Seite 6—13
Herausgeber: IEEE
2023ISBN: 978-1-6654-6548-9
3650.
Maiero, Jens; Fehling, Christian Dominic; Müser, Sinja
Does Higher Education Need Virtual Reality? A Survey
2023 11th International Conference on Information and Education Technology (ICIET), Seite 6—13
Herausgeber: IEEE
2023ISBN: 978-1-6654-6548-9
3649.
Maiero, Jens; Fehling, Christian Dominic; Müser, Sinja
Does Higher Education Need Virtual Reality? A Survey
2023 11th International Conference on Information and Education Technology (ICIET), Seite 6—13
Herausgeber: IEEE
2023ISBN: 978-1-6654-6548-9
3648.
Maiero, Jens; Fehling, Christian Dominic; Müser, Sinja
Does Higher Education Need Virtual Reality? A Survey
2023 11th International Conference on Information and Education Technology (ICIET), Seite 6—13
Herausgeber: IEEE
2023ISBN: 978-1-6654-6548-9
