Pfeiffer, Ullrich; Schuster, Christian
Non-Destructive S-Parameter Measurement of a Hermetically Encapsulated Package with Comparison to High-Frequency Simulation.
2002 IEEE 11th Topical Meeting on Electrical Performance of Electronic Packaging :323-326
Dezember 2002

Anagnostou, Georgios; Bright-Thomas, Paul; Garvey, J; Staley, R; Stokes, W; Talbot, S; Watkins, Peter; Watson, A.; Achenbach, Ricardo; Hanke, P; Husmann, Dan; Keller, Mignonette; Kluge, EE; Krause, J.; Mahboubi, K; Megele, R; Meier, K; Pfeiffer, Ullrich; Schatz, V; Silverstein, SB
Study of LVDS serial links for the ATLAS level-1 calorimeter trigger
01 2000

Krause, J. R.; Pfeiffer, Ullrich R.; Schmitt, Klaus; Stelzer, O.
The performance of a Pre-Processor Multi-Chip Module for the ATLAS Level-1 Trigger
2000