Terahertz-Light Field Camera Prototyp

18.02.2021|10:00 Uhr

Terahertz-Light Field Camera Prototyp

Light-field cameras record both the brightness and direction of the incident light rays. This spatiodirectional information can be post-processed for a dynamic focal point adjustment and 3-D imaging.

Light-field has traditionally been a domain of visible light computational imaging. Our chair is leading the development of light-field methodologies for the THz spectrum, bringing new foundational understanding and hardware capabilities for bridging the terahertz gap.

Currently, we are building the first ever THz light-field camera prototype - which consists of a 3x3 super-array of lens coupled 1k-pixel THz CMOS cameras - in a single package. The CMOS camera chip is presented in the International Solid-State Circuits Conference (ISSCC) 2021. The figure shows the prototype of the light field array. The prototype serves as the hardware platform for the development of light-field based real-time THz 3-D imaging techniques.

Preliminary work



2024

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Kollek, Kevin; Braun, Marco; Meusener, Jan-Hendrik; Krabbe, Jan-Christoph; Kummert, Anton
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Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
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Alves-Gomes, Miguel; Meyes, Richard; Meisen, Philipp; Meisen, Tobias
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Alves-Gomes, Miguel; Meyes, Richard; Meisen, Philipp; Meisen, Tobias
It's Not Always about Wide and Deep Models: Click-Through Rate Prediction with a Customer Behavior-Embedding Representation
Journal of Theoretical and Applied Electronic Commerce Research, 19 (1) :135—151
2024

3793.

Alves-Gomes, Miguel; Meyes, Richard; Meisen, Philipp; Meisen, Tobias
It's Not Always about Wide and Deep Models: Click-Through Rate Prediction with a Customer Behavior-Embedding Representation
Journal of Theoretical and Applied Electronic Commerce Research, 19 (1) :135—151
2024

3792.

Alves-Gomes, Miguel; Meyes, Richard; Meisen, Philipp; Meisen, Tobias
It's Not Always about Wide and Deep Models: Click-Through Rate Prediction with a Customer Behavior-Embedding Representation
Journal of Theoretical and Applied Electronic Commerce Research, 19 (1) :135—151
2024

3791.

Alves-Gomes, Miguel; Meyes, Richard; Meisen, Philipp; Meisen, Tobias
It’s Not Always about Wide and Deep Models: Click-Through Rate Prediction with a Customer Behavior-Embedding Representation
Journal of Theoretical and Applied Electronic Commerce Research, 19 (1) :135—151
2024

3790.

Alves-Gomes, Miguel; Meyes, Richard; Meisen, Philipp; Meisen, Tobias
It’s Not Always about Wide and Deep Models: Click-Through Rate Prediction with a Customer Behavior-Embedding Representation
Journal of Theoretical and Applied Electronic Commerce Research, 19 (1) :135—151
2024

3789.

Eric Rogers, Łukasz Hładowski; Mandra, Sławomir; Kummert, Anton
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International Journal of Control :1—8
2024
Publisher: Taylor & Francis

3788.

Eric Rogers, Łukasz Hładowski; Mandra, Sławomir; Kummert, Anton
Krzysztof Gałkowski — an obituary
International Journal of Control :1—8
2024
Publisher: Taylor & Francis

3787.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
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3786.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
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3785.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
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Page 361—374
2024
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3784.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
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2024
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3783.

Wilkening, T.; Holtz, J.; Krah, J. O.
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3782.

Ndagijimana, Adolphe; Ederra, Iñigo; Conde, Miguel Heredia
Impact of Diffraction on Terahertz Compressed Sensing Single-Pixel Imaging
2024 International Workshop on the Theory of Computational Sensing and its Applications to Radar, Multimodal Sensing and Imaging (CoSeRa), Page 76-80
2024

3781.

Müller, Nils; Reermann, Jens; Meisen, Tobias
Navigating the Depths: A Comprehensive Survey of Deep Learning for Passive Underwater Acoustic Target Recognition
IEEE Access, 12 :154092—154118
2024

3780.

Müller, Nils; Reermann, Jens; Meisen, Tobias
Navigating the Depths: A Comprehensive Survey of Deep Learning for Passive Underwater Acoustic Target Recognition
IEEE Access, 12 :154092—154118
2024

3779.

Kolonko, L.; Velten, J.; Kummert, A.
Parallelized Hardware Acceleration of Automatic Differentiating Wave Digital Filters
2024 IEEE International Symposium on Circuits and Systems (ISCAS), Page 1-5
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3778.

Kolonko, Lech; Velten, Jörg; Kummert, Anton
Parallelized Hardware Acceleration of Automatic Differentiating Wave Digital Filters
2024 IEEE International Symposium on Circuits and Systems (ISCAS), Page 1-5
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3777.


Proceedings of the 33rd ACM International Conference on Information and Knowledge Management
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3776.


Proceedings of the 33rd ACM International Conference on Information and Knowledge Management
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3775.

Weiss, Moritz; Brierley, Nick; Schmid, Mirko; Meisen, Tobias
End-To-End Deep Learning Material Discrimination Using Dual-Energy LINAC-CT
e-Journal of Nondestructive Testing, 29 (3)
2024

3774.

Hahn, Yannik; Maack, Robert; Tercan, Hasan; Meisen, Tobias; Purrio, Marion; Buchholz, Guido; Angerhausen, Matthias
Quality Prediction in Arc Welding: Leveraging Transformer Models and Discrete Representations from Vector Quantised-VAE
In Serra, Edoardo and Spezzano, Francesca, Editor, Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, Page 4522—4529
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3773.

Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers' Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Page 24—31
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400705717

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