Terahertz-Light Field Camera Prototyp

Light-field cameras record both the brightness and direction of the incident light rays. This spatiodirectional information can be post-processed for a dynamic focal point adjustment and 3-D imaging. Light-field has traditionally been a domain of visible light computational imaging. Our chair is leading the development of light-field methodologies for the THz spectrum, bringing new foundational understanding and hardware capabilities for bridging the terahertz gap.

Currently, we are building the first ever THz light-field camera prototype - which consists of a 3x3 super-array of lens coupled 1k-pixel THz CMOS cameras - in a single package. The CMOS camera chip is presented in the International Solid-State Circuits Conference (ISSCC) 2021. The figure shows the prototype of the light field array. The prototype serves as the hardware platform for the development of light-field based real-time THz 3-D imaging techniques.

Preliminary work:



2024

3904.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
Künstliche Intelligenz zur semantischen Extraktion von Bestandsdokumenten der Bauwirtschaft
Page 361—374
2024
361—374

3903.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
Künstliche Intelligenz zur semantischen Extraktion von Bestandsdokumenten der Bauwirtschaft
Page 361—374
2024
361—374

ISBN: 978-3-658-42795-5

3902.

Zoghian, Peyman Mohammed; Oberhoff, Tessa; Gölzhäuser, Peter; Großner, Maik; Jäkel, Jan-Iwo; Klemt-Albert, Katharina
Künstliche Intelligenz zur semantischen Extraktion von Bestandsdokumenten der Bauwirtschaft
Page 361—374
2024
361—374

ISBN: 978-3-658-42795-5

3901.

Wilkening, T.; Holtz, J.; Krah, J. O.
Mixed-Critical Control Architecture for Industry 5.0
2024 4th International Conference on Smart Grid and Renewable Energy (SGRE), Page 1--6
2024

3900.

Müller, Nils; Reermann, Jens; Meisen, Tobias
Navigating the Depths: A Comprehensive Survey of Deep Learning for Passive Underwater Acoustic Target Recognition
IEEE Access, 12 :154092—154118
2024

3899.

Müller, Nils; Reermann, Jens; Meisen, Tobias
Navigating the Depths: A Comprehensive Survey of Deep Learning for Passive Underwater Acoustic Target Recognition
IEEE Access, 12 :154092—154118
2024

3898.

Müller, Nils; Reermann, Jens; Meisen, Tobias
Navigating the Depths: A Comprehensive Survey of Deep Learning for Passive Underwater Acoustic Target Recognition
IEEE Access, 12 :154092—154118
2024

3897.

Kolonko, L.; Velten, J.; Kummert, A.
Parallelized Hardware Acceleration of Automatic Differentiating Wave Digital Filters
2024 IEEE International Symposium on Circuits and Systems (ISCAS), Page 1-5
2024

3896.

Kolonko, Lech; Velten, Jörg; Kummert, Anton
Parallelized Hardware Acceleration of Automatic Differentiating Wave Digital Filters
2024 IEEE International Symposium on Circuits and Systems (ISCAS), Page 1-5
2024

3895.

Stillger, Felix; Hasecke, Frederik; Meisen, Tobias
Principal Component Clustering for Semantic Segmentation in Synthetic Data Generation
2024

3894.


Proceedings of the 33rd ACM International Conference on Information and Knowledge Management
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3893.


Proceedings of the 33rd ACM International Conference on Information and Knowledge Management
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3892.

Hahn, Yannik; Maack, Robert; Tercan, Hasan; Meisen, Tobias; Purrio, Marion; Buchholz, Guido; Angerhausen, Matthias
Quality Prediction in Arc Welding: Leveraging Transformer Models and Discrete Representations from Vector Quantised-VAE
In Serra, Edoardo and Spezzano, Francesca, Editor, Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, Page 4522—4529
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3891.

Hahn, Yannik; Maack, Robert; Tercan, Hasan; Meisen, Tobias; Purrio, Marion; Buchholz, Guido; Angerhausen, Matthias
Quality Prediction in Arc Welding: Leveraging Transformer Models and Discrete Representations from Vector Quantised-VAE
In Serra, Edoardo and Spezzano, Francesca, Editor, Proceedings of the 33rd ACM International Conference on Information and Knowledge Management, Page 4522—4529
In Serra, Edoardo and Spezzano, Francesca, Editor
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400704369

3890.

Hahn, Yannik; Maack, Robert; Buchholz, Guido; Purrio, Marion; Angerhausen, Matthias; Tercan, Hasan; Meisen, Tobias
Quality Prediction in Arc Welding: Leveraging Transformer Models and Discrete Representations from Vector Quantised—VAE
Proceedings of the 33st ACM International Conference on Information & Knowledge ManagementfromCIKM '24
2024

ISBN: 979-8-4007-0436-9

3889.

Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers' Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Page 24—31
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400705717

3888.

Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers' Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Page 24—31
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400705717

3887.

Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers' Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Page 24—31
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400705717

3886.

Jantunen, Marianna; Meyes, Richard; Kurchyna, Veronika; Meisen, Tobias; Abrahamsson, Pekka; Mohanani, Rahul
Researchers’ Concerns on Artificial Intelligence Ethics: Results from a Scenario-Based Survey
Proceedings of the 7th ACM/IEEE International Workshop on Software-intensive Business, Page 24—31
Publisher: ACM, New York, NY, USA
2024

ISBN: 9798400705717

3885.

Weiss, Moritz; Meisen, Tobias
Reviewing Material-Sensitive Computed Tomography: From Handcrafted Algorithms to Modern Deep Learning
NDT, 2 (3) :286—310
2024

3884.

Weiss, Moritz; Meisen, Tobias
Reviewing Material-Sensitive Computed Tomography: From Handcrafted Algorithms to Modern Deep Learning
NDT, 2 (3) :286—310
2024

3883.

Weiss, Moritz; Meisen, Tobias
Reviewing Material-Sensitive Computed Tomography: From Handcrafted Algorithms to Modern Deep Learning
NDT, 2 (3) :286—310
2024

3882.

Weiss, Moritz; Meisen, Tobias
Reviewing Material-Sensitive Computed Tomography: From Handcrafted Algorithms to Modern Deep Learning
NDT, 2 (3) :286—310
2024

3881.

Weiss, Moritz; Meisen, Tobias
Reviewing Material-Sensitive Computed Tomography: From Handcrafted Algorithms to Modern Deep Learning
NDT, 2 (3) :286—310
2024

3880.

Meusener, Jan-Hendrik; Kollek, Kevin; Krabbe, Jan-Christoph; Kummert, Anton
Robust Cable-Length-Differences-Based Position Tracking for a Cable Driven Parallel Robot
2024 9th International Conference on Control and Robotics Engineering (ICCRE), Page 147-150
2024